[1] Feng Liang，Luwen Zhang，Shaochong Lei，Guohe Zhang*，Kaile Gao，Bin Liang，Test Patterns of Multiple SIC Vectors: Theory and Application in BIST Schemes，IEEE Transactions on very Large Scale Integradion (VLSI) Systems，21(4)，614 – 623，2013.4（SCI） [2] Guohe Zhang， Jun Shao， Feng Liang*， Dongxuan Bao，A novel Single Event Upset hardened CMOS SRAM cell，IEICE Electronics Express，9（3），140-145，2012.2（SCI） [3] Guohe Zhang，Kebin Chen，Xue Zheng，Feng Liang*，Zunchao Li，A Subthreshold Swing Model for Fully-Depleted Silicon-on-Insulator Metal–Oxide–Semiconductor Field Effect Transistors with Vertical Gaussian Profile，Japanese Journal of Applied Physics，52（1），014301:1-5，2013（SCI） [4] Guohe Zhang，Kebin Chen，Feng Liang*，A Subthreshold Current Model of Fully-Depleted Silicon-on-Insulator Metal–Oxide–Semiconductor Field Effect Transistors with Vertical Gaussian Profile，Japanese Journal of Applied Physics，51（2），024301：1-5，2012（SCI）
